Using Elmer for 'drop test' simulation ?
Using Elmer for 'drop test' simulation ?
Does anyone have experience in using Elmer for device 'drop test' simulation, perhaps even example to share or guidance to setup simulation ?
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Re: Using Elmer for 'drop test' simulation ?
Hi
I haven't heard Elmer being used in that area. I think that for drop testing people typically use explicit methods with very short timesteps. Elmer usually does implicit methods which could be rather expensive when having a large number of steps.
I could imagine that in drop testing there would also be generic contacts. Elmer can do predefined contact pairs in a limited way, and predefined contact surfaces, so there could be another shortcoming.
-Peter
I haven't heard Elmer being used in that area. I think that for drop testing people typically use explicit methods with very short timesteps. Elmer usually does implicit methods which could be rather expensive when having a large number of steps.
I could imagine that in drop testing there would also be generic contacts. Elmer can do predefined contact pairs in a limited way, and predefined contact surfaces, so there could be another shortcoming.
-Peter
Re: Using Elmer for 'drop test' simulation ?
Thank you for your comments.